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第四届机器视觉、自动识别与检测国际学术会议

2025 4th International Conference on Machine Vision Automatic Identification and Detection

MVAID
发布时间:2024-11-26 14:38:33 人浏览过
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  • 【会议简介】

    第四届机器视觉、自动识别与检测国际学术会议(MVAID 2025)定于2025年5月23至25日在中国西安隆重举行。MVAID 2025将围绕“机器视觉”与"自动识别与检测”等相关最新研究领域,为来自国内外高等院校、科学研究所、企事业单位的专家、教授、学者、工程师等提供一个分享专业经验,扩大专业网络,面对面交流新思想以及展示研究成果的国际平台,探讨本领域发展所面临的关键性挑战问题和研究方向,以期推动该领域理论、技术在高校和企业的发展和应用,欢迎各位领域内专家学者投稿参会!

    【论文出版与检索】

    目前会议在申请延续SPIE出版,所有的投稿经过严格的审稿之后,最终所录用的论文将由SPIE - The International Society for Optical Engineering (ISSN: 0277-786X)出版,出版后将提交至EI Compendex和Scopus检索 。(目前EI检索稳定,往届均已检索,最快会后3个月检索!)

    *优秀论文经扩展后可推荐至SCI评审、发表。

    【征文主题】(包括但不限于)

    ■ 机器视觉

    • 计算机视觉
    • 主动视觉
    • 三维视觉
    • 机器学习
    • 人工智能
    • 大数据和数据挖掘
    • 深度学习
    • 图像处理
    • 图像处理方法
    • 计算成像
    • 机器视觉
    • 机器视觉系统和组件
    • 光通信

    ■ 自动识别与检测技术

    • 自动识别中的人工智能技术
    • 生物识别(包括人脸识别)
    • 文件处理与识别
    • 进阶学习方法
    • 线性模型和降维
    • 自然语言处理与识别
    • 人脸和手势识别
    • 图像取证和识别
    • 微机测控装置与系统
    • 传感技术与应用
    • 自动检测与转换技术
    • 检测技术与自动化装置的研究与应用
    • 自动检测系统的控制、运行与维护
    • 光学精密工程
    • 光学仪器

    【论文要求与注意事项】

    1、论文应必须为全英文非纯综述类文章;全文提交审核;

    2、论文必须是原创,且从未在其他会议或出版物上发表过;

    3、禁止一稿多投;禁止抄袭;

    4、流程:投稿>审稿>录用>缴费注册>见刊>检索;

    5、作者投稿前可通过CrossCheck, Turnitin或其他查询系统自费查重,查重率不高于30%,

    6、请到会议网站下载模板排版,排版后论文不得少于5页,不能超过12页。投稿须知随论文模板提供下载,请务必在进行缴费注册前详细阅读投稿须知。

    【投稿与参会说明】

    1、  投稿方式:请通过投稿系统提交论文稿件(WORD&PDF)

    2、  参会报名

    (1)报告者参会:参会并在会议上进行口头报告或海报展示,请报名参会时提交报告的题目和摘要进行审核。(注:口头报告的摘要不提交出版)

    (2)听众身份参会:出席并参加这次会议, 并可全程旁听会议所有展示报告。

    注:每篇被录用的稿件可享一位作者免费参会

    Welcome to MVAID 2025 !

    2025 4th International Conference on Machine Vision Automatic Identification and Detection

    It is our utmost pleasure to extend an invitation for your esteemed presence at the 4th International Conference on Machine Vision Automatic Identification and Detection (MVAID 2025) scheduled to take place in Xi‘an China from May 23-35 2025. MVAID 2025 aims to foster a dynamic platform for global scholars and engineers engaged in the cutting-edge domains of Machine Vision Automatic Identification and Detection.

    The forefront of the global STI mega-trend witnesses China‘s continuous efforts in establishing an increasingly open environment for science technology and innovation (STI) fostering extensive academic collaborations and nurturing a vibrant innovation community that benefits all stakeholders. These endeavors not only contribute to globalization but also facilitate the creation of a shared future community.

    The MVAID conference held annually aims to convene professors researchers scholars and industrial pioneers from around the globe. MVAID serves as the foremost platform for presenting and exchanging past experiences new advances and research findings in both theoretical and industrial realms. The conference warmly welcomes contributions that foster idea exchange and rational discourse among educators and researchers worldwide. The organizing committee of the conference is delighted to extend an invitation to prospective authors for submitting their original manuscripts to MVAID 2025.

    Paper submission deadline:February 20 2025

    Registration Deadline:April 30 2025

    Conference Dates:May 23-25 2025

    Call For Papers

    The 2025 4th International Conference on Machine Vision Automatic Identification and Detection (MVAID 2025) serves as good platforms for academics researchers and engineers to meet and exchange innovative ideas and information on all aspects of Machine Vision Automatic Identification and Detection. We are delighted to invite you to participate in MVAID 2025.

    The topics of interest for submission include but are not limited to:

    ■ Machine Vision

    • · Optical imaging
    • · Image capture
    • · Light source system
    • · Digital Image Processing
    • · Sensor
    • · Active Vision
    • · 3D-Vision
    • · Artificial Intelligence
    • · Image Processing
    • · Image Processing Methods
    • · Computational Imaging
    • · Machine Vision Systems and Components

    ■ Automatic Identification and Detection Technology

    • · Artificial Intelligence Techniques in Automatic Identification
    • · Biometrics (including face recognition)
    • · Document Processing and Recognition
    • · Advanced Learning Methods
    • · Linear Models and Dimensionality Reduction
    • · Natural Language Processing and Recognition
    • · Face and gesture recognition
    • · Pattern recognition
    • · Image Forensics and Identification
    • · Microcomputer Measurement and Control Device and System
    • · Sensor Technique & Application
    • · Automatic Detection and Conversion Technology
    • · Research and Application of Detection Technology and Automation Device
    • · Control Operation and Maintenance of Automatic Detection System

    Publlication

    All full paper submissions to the MVAID 2025 will be sent to at least two reviewers and evaluated based on originality technical or research content or depth correctness relevance to conference contributions and readability. All accepted and registered papers will be published by SPIE - The International Society for Optical Engineering (ISSN: 0277-786X) which will be submitted to EI Compendex Scopus for indexing.

    标签: 西安学术会议